Proceedings
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| Filter results3 paper(s) found. |
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1. Cotton Precision Farming Adoption In The Southern United States: Findings From A 2009 SurveyThe objectives of this study were 1) to determine the status of precision farming technology adoption by cotton producers in 12 states and 2) to evaluate changes in cotton precision farming technology adoption between 2000 and 2008. A mail survey of cotton producers located in Alabama, Arkansas, Florida, Georgia, Louisiana, Mississippi, Missouri, North Carolina, South Carolina, Tennessee, Texas and Virginia was conducted in February and March of 2009 to establish the use of precision farming technologies... M. Velandia, D.F. Mooney, R.K. Roberts, B.C. English, J.A. Larson, D.M. Lambert, S.L. Larkin, M.C. Marra, R. Rejesus, S.W. Martin, K.W. Paxton, A. Mishra, C. Wang, E. Segarra, J.M. Reeves |
2. Adoption And Perceived Usefulness Of Precision Soil Sampling Information In Cotton ProductionSoil testing assists farmers in identifying nutrient variability to optimize input placement and timing. Anecdotal evidence suggests that soil test information has a useful life of 3–4 years. However, perceived usefulness may depend on a variety of factors, including field variability, farmer experience and education, farm size, Extension, and factors indirectly related to farming. In 2009, a survey of cotton farmers in 12 Southeastern states collected information... D.C. Harper, D.M. Lambert, B.C. English, J.A. Larson, R.K. Roberts, M. Velandia, D.F. Mooney, S.L. Larkin |
3. Rapid Identification of Mulberry Leaf Pests Based on Near Infrared Hyperspectral ImagingAs one of the most common mulberry pests, Diaphania pyloalis Walker (Lepidoptera: Pyralididae) has occurred and damaged in the main sericulture areas of China. Naked eye observation, the most dominating method identifying the damage of Diaphania pyloalis, is time-wasting and labor consuming. In order to improve the identification and diagnosis efficiency and avoid the massive outbreak of Diaphania pyloalis, near infrared (NIR) hyperspectral imaging technology combined with partial least discriminant... L. Yang, L. Huang, L. Meng, J. Wang, D. Wu, X. Fu, S. Li |