Proceedings
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| Filter results3 paper(s) found. |
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1. The Daily Erosion Project - High Resolution, Daily Estimates of Runoff, Detachment, Erosion, and Soil MoistureRunoff and sediment transport from agricultural uplands are substantial threats to water quality and sustained crop production. Farmers, conservationists, and policy makers must understand how landforms, soil types, farming practices, and rainfall affect soil erosion and runoff in order to improve management of soil and water resources. A system was designed and implemented a decade ago to inventory precipitation, runoff, and soil erosion across the state of Iowa, United States. That system utilized... B.K. Gelder, R. Cruse, D. James, D. Herzmann, C. Sandoval-green, T. Sklenar |
2. Evaluating the Potential of Improving In-season Nitrogen Status Diagnosis of Potato Using Leaf Fluorescence Sensors and Machine LearningPrecision nitrogen (N) management is particularly important for potato crops due to their high N fertilizer demand and high N leaching potential caused by their shallow root systems and preference for coarse-textured soils. Potato farmers have been using a standard lab analysis called petiole nitrate-N (PNN) test as a tool to diagnose potato N status and guide in-season N management. However, the PNN test suffers from many disadvantages including time constraints, labor, and cost of analysis.... S. Wakahara, Y. Miao, S. Gupta, C. Rosen, K. Mizuta, J. Zhang, D. Li |
3. Evaluating Different Strategies for In-season Potato Nitrogen Status Diagnosis Using Two Leaf SensorsAccurate and efficient in-season diagnosis of potato nitrogen (N) status is key to the success of in-season N management for improved profitability and environmental protection. Sensor-based approaches will support more timely decision making compared to plant tissue-based approaches. SPAD-502 (SPAD; Konica Minolta, Tokyo, Japan) is a commonly used sensor for potato N status diagnosis. Dualex Scientific+ (Dualex; METOS® by Pessl Instruments, Weiz, Austria) is a new leaf chlorophyll... S. Wakahara, Y. Miao, S. Gupta, C. Rosen |