Proceedings
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| Filter results3 paper(s) found. |
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1. Early Identification Of Leaf Rust On Wheat Leaves With Robust Fitting Of Hyperspectral SignaturesEarly recognition of pathogen infection is of great relevance in precision plant protection. Disease detection before the occurrence of visual symptoms is of particular interest. By use of a laserfluoroscope, UV-light induced fluorescence data were collected from healthy and with leaf rust infected wheat leaves of the susceptible cv. Ritmo 2-4 days after inoculation under controlled conditions. In order to evaluate disease impact on spectral characteristics 215 wavelengths in the range of 370-800... C. R, T. Rumpf, K. B, M. Hunsche, L. Pl, G. Noga |
2. Satellite-based On-farm Variable Rate Nitrogen Management on and Main Spatial Drivers of Cotton Yield, Nitrogen Use Efficiency, and ProfitabilityIn the United States of America, Georgia is the second largest cotton producing state, responsible for 2.6 million bales produced in 2022. In Georgia, cotton is the most economically important row crop, with ~514,000 ha harvested and $USD 1.5 billion in economic impact in the state economy in 2022. Nitrogen (N) fertilizer is one of the main inputs required to optimize cotton lint yield and quality, while also being a large input cost representing ~25% of variable costs. As a non N-fixing crop,... L. Bastos, W. Porter, G. Scarpin |
3. Proximal, Drone, and Satellite Sensors for In-season Variable Nitrogen Rate Application in Corn: a Comparative Study of Fixed-rate and Sensor-based ApproachesEffective nitrogen (N) management is essential for optimizing corn yield and enhancing agricultural sustainability. Traditional N application methods, typically uniform split pre-plant and in-season applications, often neglect the spatial and temporal variability of N requirements across different fields and years, potentially leading to N overuse. With the rise of precision agriculture technologies, it is crucial to reassess these conventional practices. This study had two main objectives: first,... A. Jakhar, A. Bhattarai, L. Bastos, G. Scarpin |